X-Ray Fluorescence Spectrometer (XRF)

The XRF is an instrument used for elemental analysis of particulate matter samples.

Data Format

• File format: To be implemented
• Sampling frequency: To be determined
• File naming pattern: To be determined
• Data structure: To be determined

Measurement Parameters

The XRF provides:

• Elemental composition analysis
• Multiple element detection
• Semi-quantitative measurements
• Non-destructive analysis

Data Processing

Data Reading

• Implementation pending
• Will handle raw XRF data files
• Will process elemental concentrations
• Will standardize output format

Quality Control

• Implementation pending
• Will include:
  • Detection limits
  • Calibration checks
  • Data validation
  • Quality flags

Output Data

The processed data will contain:

• Time index: Sample collection time
• Elemental concentrations
• Quality control flags
• Detection limits

Notes

• Non-destructive elemental analysis
• Multiple element detection capability
• Semi-quantitative measurements
• Requires proper calibration
• Implementation in progress